发明名称 SPALLING FOR A SEMICONDUCTOR SUBSTRATE
摘要 A method for spalling a layer from an ingot of a semiconductor substrate includes forming a metal layer on the ingot of the semiconductor substrate, wherein a tensile stress in the metal layer is configured to cause a fracture in the ingot; and removing the layer from the ingot at the fracture. A system for spalling a layer from an ingot of a semiconductor substrate includes a metal layer formed on the ingot of the semiconductor substrate, wherein a tensile stress in the metal layer is configured to cause a fracture in the ingot, and wherein the layer is configured to be removed from the ingot at the fracture.
申请公布号 WO2011106203(A2) 申请公布日期 2011.09.01
申请号 WO2011US24948 申请日期 2011.02.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;BEDELL, STEPHEN, W;FOGEL, KEITH, E;LAURO, PAUL, A;SADANA, DEVENDRA;SHAHRJERDI, DAVOOD 发明人 BEDELL, STEPHEN, W;FOGEL, KEITH, E;LAURO, PAUL, A;SADANA, DEVENDRA;SHAHRJERDI, DAVOOD
分类号 H01L21/304;B28D5/00 主分类号 H01L21/304
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