发明名称 MASS SPECTROMETER
摘要 <P>PROBLEM TO BE SOLVED: To accurately detect displacement without using a sample plate specially processed when the sample plate is placed on a stage after a matrix is attached, correct the displacement, and implement a correct mass spectrometric analysis of an area designated by an analyst. <P>SOLUTION: When the sample plate 3 is placed on the sample stage 2, an irradiation sign formation control part 22 timely moves the sample stage 2, irradiates the sample plate 3 with a high power laser light in a short time, and forms an irradiation sign at a predetermined position on the sample plate 3. Since the irradiation sign has a unique shape, a microscopic observation image of the irradiation sign is obtained, and saved in an image saving part 32. After the sample plate 3 extracted from the stage 2 is placed on the stage 2 again, the displacement quantity is calculated from a difference between the position of the irradiation sign on the image obtained at the time and the position of the irradiation sign on the image saved in the saving part 32. An analysis position correcting part 24 corrects position information on the area designated by the analyst in response to the found the displacement quantity. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011169740(A) 申请公布日期 2011.09.01
申请号 JP20100033731 申请日期 2010.02.18
申请人 SHIMADZU CORP 发明人 IKEGAMI MASAHIRO;HARADA TAKAHIRO
分类号 G01N27/62;G01N27/64;H01J49/10 主分类号 G01N27/62
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