发明名称 |
MASK BLANK GLASS SUBSTRATE, MASK BLANK, MASK AND REFLECTIVE MASK AND METHOD FOR MANUFACTURING THESE |
摘要 |
<P>PROBLEM TO BE SOLVED: To properly form a marker less liable to cause dust generation on a mask blank glass substrate. <P>SOLUTION: A mask blank glass substrate used in the manufacture of a mask blank is prepared and a marker 18 expressing information for identifying or managing the mask blank glass substrate in a plurality of recesses 20 is formed on the surface of a region of the mask blank glass substrate having no influence on the fabrication of a transfer pattern. The recesses 20 constituting the marker 18 are round pits having substantially circular edges, and the interval L1 between the adjacent recesses 20 is ≥50 μm. The marker 18 is formed, e.g., on an end face of the mask blank glass substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011170359(A) |
申请公布日期 |
2011.09.01 |
申请号 |
JP20110037924 |
申请日期 |
2011.02.24 |
申请人 |
HOYA CORP |
发明人 |
KASAHARA HISASHI;OKUBO YASUSHI |
分类号 |
B23K26/00;B23K26/38;C03C15/00;C03C23/00;G03F1/38;G03F1/50 |
主分类号 |
B23K26/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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