发明名称 MASK BLANK GLASS SUBSTRATE, MASK BLANK, MASK AND REFLECTIVE MASK AND METHOD FOR MANUFACTURING THESE
摘要 <P>PROBLEM TO BE SOLVED: To properly form a marker less liable to cause dust generation on a mask blank glass substrate. <P>SOLUTION: A mask blank glass substrate used in the manufacture of a mask blank is prepared and a marker 18 expressing information for identifying or managing the mask blank glass substrate in a plurality of recesses 20 is formed on the surface of a region of the mask blank glass substrate having no influence on the fabrication of a transfer pattern. The recesses 20 constituting the marker 18 are round pits having substantially circular edges, and the interval L1 between the adjacent recesses 20 is &ge;50 &mu;m. The marker 18 is formed, e.g., on an end face of the mask blank glass substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011170359(A) 申请公布日期 2011.09.01
申请号 JP20110037924 申请日期 2011.02.24
申请人 HOYA CORP 发明人 KASAHARA HISASHI;OKUBO YASUSHI
分类号 B23K26/00;B23K26/38;C03C15/00;C03C23/00;G03F1/38;G03F1/50 主分类号 B23K26/00
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