发明名称 USE OF HIGH ENERGY HEAVY ION BEAM FOR DIRECT SPUTTERING
摘要 High energy heavy ions are used to produce free space regions by sputtering the high energy beam through a mask onto a substrate. The invention also includes a method of focusing the high energy beam with a beam focusing system. The invention is in part based on an experiment in which 900 keV gold ions were used to sputter aluminum, copper, silicon and silver. The results demonstrate the possibility that high energy heavy ions could be used to fabricate microstructures in selected metals and silicon in a single step process.
申请公布号 US2011209983(A1) 申请公布日期 2011.09.01
申请号 US20090806217 申请日期 2009.04.03
申请人 GLASS GARY A;DYMNIKOV ALEXANDER D;ROUT BIBHUDUTTA 发明人 GLASS GARY A.;DYMNIKOV ALEXANDER D.;ROUT BIBHUDUTTA
分类号 C23C14/46 主分类号 C23C14/46
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