发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT AND DEPOSITION APPARATUS
摘要 An object of the present invention is to provide an apparatus for successive deposition used for manufacturing a semiconductor element including an oxide semiconductor in which impurities are not included. By using the deposition apparatus capable of successive deposition of the present invention that keeps its inside in high vacuum state, and thus allows films to be deposited without being exposed to the air, the entry of impurities such as hydrogen into the oxide semiconductor layer and the layer being in contact with the oxide semiconductor layer can be prevented; as a result, a semiconductor element including a high-purity oxide semiconductor layer in which hydrogen concentration is sufficiently reduced can be manufactured. In such a semiconductor element, off-state current is low, and a semiconductor device with low power consumption can be realized.
申请公布号 US2011212605(A1) 申请公布日期 2011.09.01
申请号 US201113029169 申请日期 2011.02.17
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;TAKASE NATSUKO
分类号 H01L21/203;C23C14/34;C23C16/44 主分类号 H01L21/203
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