发明名称 METHOD FOR MANUFACTURING NONVOLATILE MEMORY DEVICE, NONVOLATILE MEMORY ELEMENT, AND NONVOLATILE MEMORY DEVICE
摘要 <p>Disclosed is a manufacturing method, whereby a nonvolatile memory device having a stable memory performance can be manufactured with a simple process. The method includes: a step wherein a laminated structure is formed by alternately laminating, on a substrate (11), a plurality of conductive layers (13) containing a transition metal, and a plurality of interlayer insulating films (17) composed of an insulating material; a step wherein a contact hole, which penetrates the laminated structure and exposes parts of the respective conductive layers (13) is formed; a step wherein the conductive layer (13) parts exposed in the contact hole are oxidized, and variable-resistance layers (14) wherein resistance values reversibly change on the basis of electrical signals transmitted thereto are formed; and a step wherein a conductive material is embedded in the contact hole, and a columnar electrode (12) connected to the variable-resistance layers (14) is formed in the contact hole.</p>
申请公布号 WO2011105060(A1) 申请公布日期 2011.09.01
申请号 WO2011JP01001 申请日期 2011.02.23
申请人 PANASONIC CORPORATION;WEI, ZHIQIANG;TAKAGI, TAKESHI;IIJIMA, MITSUTERU 发明人 WEI, ZHIQIANG;TAKAGI, TAKESHI;IIJIMA, MITSUTERU
分类号 H01L27/105;G11C13/00;H01L45/00 主分类号 H01L27/105
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