| 摘要 |
A device for measuring a variation in the capacitance of a variable capacitive structure, includes: a supply voltage; a reference capacitance; element for measuring a voltage across the terminals of the reference capacitance; a measurement capacitive structure; and elements for detecting a threshold voltage across the terminals of the reference capacitance. The device is configured/programmed so that the measurement capacitive structure is discharged, in a variable number of discharges, into the reference capacitance after the variable capacitive structure has been discharged, in a fixed number of discharges, into the reference capacitance and until the voltage (VS) across the terminals of the reference capacitance has reached the threshold voltage. The variation in the variable number of discharges relative to a previously obtained number of discharges allows the variation in the capacitance of the variable capacitive structure to be estimated.
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