发明名称 Frequency-based approach for detection and classification of hard-disc defect regions
摘要 <p>In a hard-disc drive read channel, frequency-based measures are generated at two different data frequencies (e.g., 2T and DC) by applying a transform, such as a discrete Fourier transform (DFT), to signal values, such as ADC or equalizer output values, corresponding to, e.g., a 2T data pattern stored on the hard disc. The frequency-based measures are used to detect defect regions on the hard disc and/or to classify defect regions as being due to either thermal asperity (TA) or drop-out media defect (MD).</p>
申请公布号 EP2362395(A2) 申请公布日期 2011.08.31
申请号 EP20110000843 申请日期 2011.02.03
申请人 LSI CORPORATION 发明人 MATHEW, GEORGE;HAN, YANG;YANG, SHAOHUA;LI, ZONGWANG;LEE, YUAN, XING
分类号 G11B20/18;G11B5/012;G11B19/04;G11B27/36 主分类号 G11B20/18
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