发明名称 Methods of forming impurity containing insulating films and flash memory devices including the same
摘要 Methods of forming an insulating film include forming an insulating film on a substrate. A first impurity is injected into the insulating film using a thermal process under a first set of processing conditions to form a first impurity concentration peak in a lower portion of the insulating film. A second impurity is injected into the insulating film using the thermal process under a second set of processing conditions, different from the first set of processing conditions, to form a second impurity concentration peak in an upper portion of the insulating film. Injecting the first impurity and injecting the second impurity may be carried out without using plasma and the first impurity concentration peak may be higher than the second impurity concentration peak.
申请公布号 US8008154(B2) 申请公布日期 2011.08.30
申请号 US20080188482 申请日期 2008.08.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NOH YOUNG-JIN;KOO BON-YOUNG;CHOI SI-YOUNG;HWANG KI-HYUN;KIM CHUL-SUNG;BAEK SUNG-KWEON;HEO JIN-HWA
分类号 H01L21/336 主分类号 H01L21/336
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