发明名称 Method for fabricating semiconductor device with an intermediate stack structure
摘要 A method for fabricating a semiconductor device includes forming a first conductive layer over a substrate, forming an intermediate structure over the first conductive layer, the intermediate structure formed in a stack structure comprising at least a first metal layer and a nitrogen containing metal silicide layer, and forming a second conductive layer over the intermediate structure.
申请公布号 US8008178(B2) 申请公布日期 2011.08.30
申请号 US20070952128 申请日期 2007.12.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LIM KWAN-YONG;YANG HONG-SEON;CHO HEUNG-JAE;KIM TAE-KYUNG;KIM YONG-SOO;SUNG MIN-GYU
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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