发明名称 Methods of fabricating flash memory devices including substantially uniform tunnel oxide layers
摘要 A method of forming a flash memory device in a memory cell region of a substrate includes forming a first insulating layer on the substrate, forming a first conductive layer on the first insulating layer, forming trench isolation regions in the substrate extending through the first conductive layer and the first insulating layer to define an active region in the memory cell region between the trench isolation regions, and selectively removing the first conductive layer and the first insulating layer from the memory cell region of the substrate to expose a surface of the active region between the trench isolation regions.
申请公布号 US8008150(B2) 申请公布日期 2011.08.30
申请号 US20100789560 申请日期 2010.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JAE-HOON
分类号 H01L21/336 主分类号 H01L21/336
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