发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 In order to improve characteristics of an IGBT, particularly, to reduce steady loss, turn-off time and turn-off loss, a thickness of a surface semiconductor layer is set to about 20 nm to 100 nm in an IGBT including: a base layer; a buried insulating film provided with an opening part; the surface semiconductor layer connected to the base layer below the opening part; a p type channel forming layer formed in the surface semiconductor layer; an n+ type source layer; a p+ type emitter layer; a gate electrode formed over the surface semiconductor layer via a gate insulating film; an n+ type buffer layer; and a p type collector layer.
申请公布号 US2011204413(A1) 申请公布日期 2011.08.25
申请号 US201013060737 申请日期 2010.02.25
申请人 ARAI DAISUKE;NAKAZAWA YOSHITO;HOSOYA NORIO 发明人 ARAI DAISUKE;NAKAZAWA YOSHITO;HOSOYA NORIO
分类号 H01L29/74;H01L21/332 主分类号 H01L29/74
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