发明名称 CALIBRATION STANDARDS AND METHODS OF THEIR FABRICATION AND USE
摘要 An embodiment of a calibration standard includes a substrate, a set of conductive structures fabricated on the substrate, and a conductive end structure fabricated on the substrate. The set of conductive structures include an inner conductive structure, a first outer conductive structure positioned to one side of the inner conductive structure, and a second outer conductive structure positioned to an opposite side of the inner conductive structure. The inner and outer conductive structures are aligned in parallel with each other along offset principal axes of the inner and outer conductive structures. The conductive end structure is electrically connected between an end of the first outer conductive structure and an end of the second outer conductive structure, and the conductive end structure is spatially separated from an end of the inner conductive structure at the surface of the substrate.
申请公布号 US2011208467(A1) 申请公布日期 2011.08.25
申请号 US20100710497 申请日期 2010.02.23
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 TANG JINBANG
分类号 G01R31/02;G06F19/00;H01L21/768;H01L23/48 主分类号 G01R31/02
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