| 摘要 |
A system for connecting a test pin of automatic test equipment (ATE) to devices for testing includes a first handler for manipulating a first portion and a second handler for manipulating a second portion of devices. A first wire connected to first socket(s) and a second wire connected to second socket(s) are connected to a relay connected to the test pin. The first handler connects first portion devices to the first socket. The second handler connects second portion devices to the second socket. A controller connects the first handler, second handler, and relay, for switching the relay to the first wire for testing in first socket if the first handler has connected any first portion device, and to the second wire for testing in second socket if the second handler has connected any second portion device. The controller multiplexes two handlers, or dual manipulators, asynchronously for immediate switch of testing. |
