发明名称 |
Dynamic power control for nanoscale spectroscopy |
摘要 |
Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.
|
申请公布号 |
US2011203357(A1) |
申请公布日期 |
2011.08.25 |
申请号 |
US20100660266 |
申请日期 |
2010.02.23 |
申请人 |
PRATER CRAIG;KJOLLER KEVIN |
发明人 |
PRATER CRAIG;KJOLLER KEVIN |
分类号 |
G01N13/00 |
主分类号 |
G01N13/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|