发明名称 PROCESSING SYSTEM AND METHOD FOR CHEMICALLY TREATING A SUBSTRATE
摘要 A processing system and method for chemically treating a substrate, wherein the processing system comprises a temperature controlled chemical treatment chamber, and an independently temperature controlled substrate holder for supporting a substrate for chemical treatment. The substrate is exposed to a gaseous chemistry, without plasma, under controlled conditions including wall temperature, surface temperature and gas pressure. The chemical treatment of the substrate chemically alters exposed surfaces on the substrate.
申请公布号 US2011204029(A1) 申请公布日期 2011.08.25
申请号 US201113093410 申请日期 2011.04.25
申请人 TOKYO ELECTRON LIMITED 发明人 HAMELIN THOMAS;WALLACE JAY;LAFLAMME, JR. ARTHUR
分类号 C23F1/00;C23C16/44;C25D11/02;H01L21/00;H01L21/677 主分类号 C23F1/00
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