发明名称 METHOD OF DETACHING SEMI-CONDUCTOR LAYERS AT LOW TEMPERATURE
摘要 A method for producing a structure having an ultra thin buried oxide (UTBOX) layer by assembling a donor substrate with a receiver substrate wherein at least one of the substrates includes an insulating layer having a thickness of less than 50 nm that faces the other substrate, conducting a first heat treatment for reinforcing the assembly between the two substrates at temperature below 400° C., and conducting a second heat treatment at temperature above 900° C., wherein the exposure time between 400° C. and 900° C. between the heat treatments is less than 1 minute and advantageously less than 30 seconds.
申请公布号 US2011207295(A1) 申请公布日期 2011.08.25
申请号 US200913126655 申请日期 2009.10.29
申请人 LANDRU DIDIER;RADU IONUT;VINCENT SEBASTIEN 发明人 LANDRU DIDIER;RADU IONUT;VINCENT SEBASTIEN
分类号 H01L21/762 主分类号 H01L21/762
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