发明名称 TRANSISTOR AND MANUFACTURING METHOD OF THE SAME
摘要 A transistor is manufactured by a method including: forming a first wiring layer; forming a first insulating film to cover the first wiring layer; forming a semiconductor layer over the first insulating film; forming a conductive film over the semiconductor layer; and performing at least two steps of etching on the conductive film to form second wiring layers which are apart from each other, wherein the two steps of etching include at least a first etching process performed under the condition that the etching rate for the conductive film is higher than the etching rate for the semiconductor layer, and a second etching process performed under the condition that the etching rates for the conductive film and the semiconductor layer are higher than those of the first etching process.
申请公布号 US2011207269(A1) 申请公布日期 2011.08.25
申请号 US201113026520 申请日期 2011.02.14
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SASAGAWA SHINYA;TSUBUKU MASASHI;NAKAYAMA HITOSHI;SHIMADA DAIGO
分类号 H01L21/44 主分类号 H01L21/44
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