| 摘要 |
Provided is a test apparatus that tests a device under test, comprising a plurality of processing sections that each send and receive signals to and from the device under test; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections, wherein, when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state. |
