发明名称 PHASE-CHANGE MEMORY ELEMENTS AND FABRICATION METHOD THEREOF
摘要 <p>PURPOSE: A phase change memory device and a manufacturing method thereof are provided to improve the retention property of a device by adding a chalcogenides compound with boron nitride to a phase change material. CONSTITUTION: In a phase change memory device and a manufacturing method thereof, a first electrode(11) is formed on a semiconductor substrate(10). A first insulating layer is formed on the first electrode. A first electrode contact(13) is formed on the first insulating layer. A phase changing material film(14) including boron nitride is formed on the first electrode contact. A second electrode(16) is formed on the phase changing material film.</p>
申请公布号 KR20110094391(A) 申请公布日期 2011.08.24
申请号 KR20100013724 申请日期 2010.02.16
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 CHO, MANN HO;JANG, MOON HYUNG;PARK, SEUNG JONG;PARK, SUNG JIN;JEONG, KWANG SIK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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