PHASE-CHANGE MEMORY ELEMENTS AND FABRICATION METHOD THEREOF
摘要
<p>PURPOSE: A phase change memory device and a manufacturing method thereof are provided to improve the retention property of a device by adding a chalcogenides compound with boron nitride to a phase change material. CONSTITUTION: In a phase change memory device and a manufacturing method thereof, a first electrode(11) is formed on a semiconductor substrate(10). A first insulating layer is formed on the first electrode. A first electrode contact(13) is formed on the first insulating layer. A phase changing material film(14) including boron nitride is formed on the first electrode contact. A second electrode(16) is formed on the phase changing material film.</p>
申请公布号
KR20110094391(A)
申请公布日期
2011.08.24
申请号
KR20100013724
申请日期
2010.02.16
申请人
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
发明人
CHO, MANN HO;JANG, MOON HYUNG;PARK, SEUNG JONG;PARK, SUNG JIN;JEONG, KWANG SIK