| 摘要 |
A measuring device 1 for measuring structures is provided, wherein the measuring device including two inertial measuring units 3, 4 arranged at a distance from each other. The measuring device can be provided with means for engaging the constructions that are measured. Also, an arrangement including a measuring device and a base station 21 providing a reference point for the measuring device is provided. Moreover, a kit including the measuring device and adaptors are provided, wherein the adaptors can provide an interface between the measuring device and a measured construction. A method for measuring a stationary construction is also provided, using a measuring device, preferably a measuring kit. |
