METHOD FOR FORMING METAL FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要
PURPOSE: A method for forming metal film and a method for manufacturing a semiconductor device using the same are provided to improve the reliability and productivity of a semiconductor device by forming a metal line having improved signal transmission speed through low price simple process. CONSTITUTION: In a method for forming metal film and a method for manufacturing a semiconductor device using the same, a hole exposing a conductive region(104) is formed on a substrate(100). A barrier film is formed on the inner wall of a hole and on the top of an insulating layer pattern(120). A first metal layer is formed on the barrier film. A barrier film pattern(130A) and a first metal layer pattern(140A) are formed by removing the unnecessary part of the insulating layer pattern. A second metal-capping layer(170) is formed on the insulating layer pattern and the first metal layer pattern.
申请公布号
KR20110094466(A)
申请公布日期
2011.08.24
申请号
KR20100013856
申请日期
2010.02.16
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
JUNG, EUN JI;SOHN, WOONG HEE;KIM, SU KYOUNG;CHOI, GIL HEYUN;KIM, BYUNG HEE