| 发明名称 |
Semiconductor nanoparticle fluorescent reagent and fluorescence determination method |
| 摘要 |
The present invention measures defect fluorescence exhibited from a defect level mainly on a semiconductor nanoparticle surface site which has an energy level existing inside the forbidden band of energy levels inside the semiconductor nanoparticle. |
| 申请公布号 |
US8003409(B2) |
申请公布日期 |
2011.08.23 |
| 申请号 |
US20060389151 |
申请日期 |
2006.03.27 |
| 申请人 |
HITACHI SOFTWARE ENGINEERING CO., LTD. |
发明人 |
SATO KEIICHI;KUWABATA SUSUMU |
| 分类号 |
G01N33/553;B32B5/16;C01G9/08;C01G11/02;C40B40/06;G01N21/64;G01N33/53;G01N33/533;G01N33/566;G01N33/58 |
主分类号 |
G01N33/553 |
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