发明名称 Method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a talbot interferometer
摘要 In a method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a Talbot interferometer for projective and tomographical x-ray phase contrast imaging and/or x-ray dark field imaging, after an irradiation of the examination subject with at least two coherent or quasi-coherent x-rays, an interference of the at least two coherent or quasi-coherent x-rays with the aid of an irradiated phase grating is generated, and the variation of multiple intensity measurements in temporal succession after an analysis grating is determined in relation to known displacements of one of the gratings or of an x-ray source fashioned like a grating, positioned upstream in the beam path, relative to one of the gratings. The integrating intensity measurements ensue during a relative movement—thus not during the standstill—of one of the upstream gratings or of the x-ray source fashioned like a grating or of the examination subject, with known speed behavior over a final time interval of a final distance.
申请公布号 US8005185(B2) 申请公布日期 2011.08.23
申请号 US20090565989 申请日期 2009.09.24
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 POPESCU STEFAN
分类号 A61B6/00 主分类号 A61B6/00
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