发明名称 Method and device for determining the temperature of a substrate
摘要 The publication discloses a method for determining a temperature of a substrate, comprising: providing a gas channel that is confined by at least one wall having a certain wall temperature; providing a substrate in said gas channel, proximate to the at least one wall, such that a gap exists between a surface of the substrate and the at least one wall; providing a gas flow with a certain mass flow rate through said gas channel, which gas flow extends at least partially through said gap; determining a pressure drop in the gas flow along the gas channel; and deriving from said pressure drop the temperature of said substrate using a pre-determined relation between the pressure drop along the gas channel, the wall temperature and the temperature of the substrate, at said mass flow rate. Also disclosed is a device for implementing the disclosed method.
申请公布号 US8002463(B2) 申请公布日期 2011.08.23
申请号 US20080138848 申请日期 2008.06.13
申请人 ASM INTERNATIONAL N.V. 发明人 GRANNEMAN ERNST H. A.;VERMONT PASCAL;KUZNETSOV VLADIMIR
分类号 G01K13/02;B05C11/10;G01R31/00;H01L21/00 主分类号 G01K13/02
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