发明名称 Semiconductor memory device and semiconductor memory device test method
摘要 A semiconductor memory device having a first memory block used when it is determined to be used in a first case, a second memory block used as an alternative of the first memory blocks when it is determined to be used in a second case, a write section that writes determination data into the first memory block for making a determination at the time of the determination and writes the determination data into the second memory block and a read section that reads the determination data written into the first memory block by the write section for making a determination at the time of the determination and reads the determination data written into the second memory block by the write section.
申请公布号 US8006143(B2) 申请公布日期 2011.08.23
申请号 US20090393145 申请日期 2009.02.26
申请人 FUJITSU LIMITED 发明人 KAMBARA FUMI
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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