发明名称 System for simplified correlation of instrumentation probes and data displays
摘要 A system for testing a device under test includes a probe that detects a signal from the device under test, a display device that depicts a trace based on the signal, where the trace exhibits an attribute, and an indicator that emits an indication signal based on the attribute.
申请公布号 US8004273(B1) 申请公布日期 2011.08.23
申请号 US20080147255 申请日期 2008.06.26
申请人 MARVELL INTERNATIONAL LTD. 发明人 MCKINLEY PATRICK A.;CARLSON GREGORY F.;GOSS STEVEN M.
分类号 G01R1/06;G01R13/20;G01R31/02 主分类号 G01R1/06
代理机构 代理人
主权项
地址