发明名称 Method of manufacturing a semiconductor device having a reverse staggered thin film transistor
摘要 A gate electrode is formed by forming a first conductive layer containing aluminum as its main component over a substrate, forming a second conductive layer made from a material different from that used for forming the first conductive layer over the first conductive layer; and patterning the first conductive layer and the second conductive layer. Further, the first conductive layer includes one or more selected from carbon, chromium, tantalum, tungsten, molybdenum, titanium, silicon, and nickel. And the second conductive layer includes one or more selected from chromium, tantalum, tungsten, molybdenum, titanium, silicon, and nickel, or nitride of these materials.
申请公布号 US8003449(B2) 申请公布日期 2011.08.23
申请号 US20050284445 申请日期 2005.11.22
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 AKIMOTO KENGO;MARUYAMA HOTAKA
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
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