发明名称 APPARATUS FOR MEASUREMENT OF ION IN ATMOSPHERE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus capable of readily measuring an amount of ions. SOLUTION: An ion monitor 1 includes a main body 10, and a first portion 11 and a second portion 12 extending from the main body 10. The first portion 11 contains a first wall surface 21, and the second portion 12 contains a second wall surface 22. The first wall surface 21 and the second wall surface 22 are arranged facing each other across a space opened to atmosphere 5, consist of a conductive resin or a conductive ceramic, and are insulated from the main body 10. The ion monitor 1 further includes an ammeter 31 indicating the amount of ions captured by the first wall surface 21 and an ammeter 32 indicating the amount of ions captured by the second wall surface 22. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011158428(A) 申请公布日期 2011.08.18
申请号 JP20100022181 申请日期 2010.02.03
申请人 MICRO CONTROL SYSTEMS KK 发明人 HASHIBA SOICHI;MINOWA AKIHIKO;YODA FUMIHIRO
分类号 G01N27/60;G01R29/24 主分类号 G01N27/60
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