发明名称 |
High voltage impulse test system with a correction algorithm |
摘要 |
A correction algorithm is used in order to reduce the systematic measurement error arising from the evaluation device of an impulse voltage test system. It is advantageous to install the high-voltage divider as intermediate circuit. This arrangement requires only one high-voltage connection between the components of the test system and the device under test. The correction function uK(t) is the difference between the voltage at the device under test uP(t) and the voltage at the high-voltage divider uT(t).
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申请公布号 |
US2011202294(A1) |
申请公布日期 |
2011.08.18 |
申请号 |
US20110931559 |
申请日期 |
2011.02.04 |
申请人 |
HINOW MARTIN;HINOW GEORGE |
发明人 |
HINOW MARTIN;HINOW GEORGE |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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