| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a printed matter inspection device for inspecting a print defect of a printed matter on which the same pattern is printed repeatedly. <P>SOLUTION: This printed matter inspection device includes: an inspection condition determination means classified by domain for setting an optical inspection spot and an optional inspection domain on a printed pattern in one printed image frame of the printed matter, and setting an inspection condition of a print defect in each inspection spot and inspection domain; a signal generation means for generating a trigger signal for imaging; an imaging means for acquiring the trigger signal for imaging, and imaging the printed matter in each one image frame; and a print defect detection means for comparing each part corresponding to the inspection spot and the inspection domain in information of an image to be inspected in each one image frame acquired by being imaged by the imaging means and in reference image information acquired by imaging one image frame on which a reference pattern used as a reference is formed, and detecting the print defect based on each inspection condition set in the classified state by each inspection spot and inspection domain. <P>COPYRIGHT: (C)2011,JPO&INPIT |
