发明名称 TEMPERATURE CHARACTERISTIC ADJUSTMENT DATA GENERATING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for generating adjustment data of a temperature characteristic which can reduce the influence of an n-th temperature coefficient and suppress an increase in cost when adjusting the (n-1)-th temperature coefficient of a signal having a temperature characteristic represented by an n(n is an integer≥1)-th function. SOLUTION: The temperature characteristic adjustment data generating method is a method which uses program processors (6 and 10) to generate data (803) for adjusting the temperature characteristic of a semiconductor device having a circuit for generating a signal having a temperature characteristic represented by the (n is an integer≥1)-th function, and includes data generation processing which generates data for adjusting a temperature characteristic so as to make the value of the signal at temperature whose number is smaller than n+1 close to a value (601) obtained by adding a prescribed correction value to a target value about the signal. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011160081(A) 申请公布日期 2011.08.18
申请号 JP20100018465 申请日期 2010.01.29
申请人 RENESAS ELECTRONICS CORP 发明人 TERADA TAKAHIDE;ITO TAKAYASU;ARISAKA NAOYA
分类号 H03L1/02;H03B5/04 主分类号 H03L1/02
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