发明名称 Y-DECODE CONTROLLED DUAL RAIL MEMORY
摘要 An embodiment of the invention is related to a memory that includes a memory array having a plurality of memory banks, each of which includes a plurality of rows and a plurality of columns of memory cells. Each memory column includes a switch circuit providing a first voltage and a second voltage to memory cells in the column and to the pre-charge circuit associated with the column. In an application, at one particular point in time (e.g., an accessed cycle), only one column in a memory bank uses the operating voltage Ovoltage while the other N−1 columns in the same memory bank use the retention voltage Rvoltage. Other embodiments are also disclosed.
申请公布号 US2011199846(A1) 申请公布日期 2011.08.18
申请号 US20100706208 申请日期 2010.02.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TAO DEREK
分类号 G11C7/00;G11C8/10 主分类号 G11C7/00
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