发明名称 SEMICONDUCTOR STRUCTURE HAVING AN AIR-GAP REGION AND A METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor structure includes a first metal-containing layer, a dielectric capping layer, a second metal-containing layer, and a conductive pad. The first metal-containing layer includes a set of metal structures, a dielectric filler disposed to occupy a portion of the first metal-containing layer, and an air-gap region defined by at least the set of metal structures and the dielectric filler and abutting at least a portion of the set of metal structures. The second metal-containing layer includes at least a via plug electrically connected to a portion of the set of metal structures. The conductive pad and the via plug do not overlap the air-gap region.
申请公布号 US2011198757(A1) 申请公布日期 2011.08.18
申请号 US20100707969 申请日期 2010.02.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 SU SHU-HUI;HUANG CHENG-LIN;YANG JIING-FENG;WU ZHEN-CHENG;WU REN-GUEI;CHEN DIAN-HAU;MLL YUH-JIER
分类号 H01L23/48;G03F1/00;H01L21/768;H01L23/498 主分类号 H01L23/48
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