发明名称 |
SEMICONDUCTOR STRUCTURE HAVING AN AIR-GAP REGION AND A METHOD OF MANUFACTURING THE SAME |
摘要 |
A semiconductor structure includes a first metal-containing layer, a dielectric capping layer, a second metal-containing layer, and a conductive pad. The first metal-containing layer includes a set of metal structures, a dielectric filler disposed to occupy a portion of the first metal-containing layer, and an air-gap region defined by at least the set of metal structures and the dielectric filler and abutting at least a portion of the set of metal structures. The second metal-containing layer includes at least a via plug electrically connected to a portion of the set of metal structures. The conductive pad and the via plug do not overlap the air-gap region.
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申请公布号 |
US2011198757(A1) |
申请公布日期 |
2011.08.18 |
申请号 |
US20100707969 |
申请日期 |
2010.02.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
SU SHU-HUI;HUANG CHENG-LIN;YANG JIING-FENG;WU ZHEN-CHENG;WU REN-GUEI;CHEN DIAN-HAU;MLL YUH-JIER |
分类号 |
H01L23/48;G03F1/00;H01L21/768;H01L23/498 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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