发明名称 METHOD AND APPARATUS FOR CALIBRATING A TEST SYSTEM FOR MEASURING A DEVICE UNDER TEST
摘要 Methods and apparatus for calibrating a vector network analyzer (VNA) and characterizing a device under test. In one example, a device fixture including a pair of embedded device adapters provides an interface between a device under test (DUT) with non-coaxial connectors and the coaxial connectors of the VNA, and moves the calibration reference plane from the coaxial connectors of the VNA to a DUT reference plane at the leads/connectors of the DUT. A through fixture having a pair of similar through adapters is used to establish the DUT reference plane and to facilitate characterizing the device adapters such that they can be de-embedded from measurements of the device fixture.
申请公布号 US2011199107(A1) 申请公布日期 2011.08.18
申请号 US201113021919 申请日期 2011.02.07
申请人 ATE SYSTEMS, INC. 发明人 ADAMIAN VAHE A.;PHILLIPS PETER V.
分类号 G01R31/00 主分类号 G01R31/00
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