| 摘要 |
PROBLEM TO BE SOLVED: To provide a chromatic aberration measuring method, capable of efficiently measuring the chromatic aberration. SOLUTION: An image of light of each wavelength is reflected in the fluorescent sample image with an inclination conforming to a difference in the chromatic aberration by moving relative positions of a fluorescent sample SPE and an image sensor 30 while the focal point of an objective lens 12 is moved in the direction of the optical axis so that the moving directions may be varied in a surface direction intersecting the moving direction of the focal point at right angles to acquire a fluorescent sample image by making the image sensor 30 exposed in the meantime, thereby a microscope device 1 can measure the chromatic aberration, based on this inclination. Accordingly, the number of sheets of the fluorescent sample images can be lessened in comparison with that of conventional ones. Consequently, an imaging time can be shortened and thus the chromatic aberration can be measured efficiently. COPYRIGHT: (C)2011,JPO&INPIT
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