发明名称 Three dimensional structure memory
摘要 A Three-Dimensional Structure (3DS) Memory allows for physical separation of the memory circuits and the control logic circuit onto different layers such that each layer may be separately optimized. One control logic circuit suffices for several memory circuits, reducing cost. Fabrication of 3DS memory involves thinning of the memory circuit to less than 50 μm in thickness and bonding the circuit to a circuit stack while still in wafer substrate form. Fine-grain high density inter-layer vertical bus connections are used. The 3DS memory manufacturing method enables several performance and physical size efficiencies, and is implemented with established semiconductor processing techniques.
申请公布号 US2011198672(A1) 申请公布日期 2011.08.18
申请号 US20100788618 申请日期 2010.05.27
申请人 发明人 LEEDY GLENN J.
分类号 H01L23/52;H01L21/768;H01L27/06;H01L27/108 主分类号 H01L23/52
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