发明名称 NEAR-INFRARED PHOTODETECTOR AND IMAGE SENSOR EMPLOYING THE SAME AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A near infrared ray detector, an image sensor using the same, and a semiconductor manufacturing method thereof are provided to form a silicon film whose thickness is 70nm, thereby obtaining a very quickly response feature. CONSTITUTION: A semiconductor area is formed on a substrate. An antenna(28) includes first and second arms on the substrate. The antenna includes the semiconductor area between the arms. First and second electrodes(30) are separated on the substrate wherein the semiconductor area is placed between the first and second electrodes. An avalanche gain is generated in the semiconductor area by applying a bias voltage to the electrodes.
申请公布号 KR20110093535(A) 申请公布日期 2011.08.18
申请号 KR20100021832 申请日期 2010.03.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOON DONG;MILLER DAVID ANDREW BARCLAY;JIN, YOUNG GU;JO, EIN SUNG
分类号 H01L31/101;H01L27/146 主分类号 H01L31/101
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