CONTACT PROBE AND ELECTRONIC CIRCUIT TESTING DEVICE USING IT

摘要

PROBLEM TO BE SOLVED: To provide a contact probe allowing easy and inexpensive maintenance of the contact probe and an electronic circuit testing device using it. SOLUTION: The contact probe includes a sleeve consisting of a conductive cylindrical body, a conductive plunger engaging slidably in the sleeve, and a spring disposed in the sleeve and pressing the plunger in an axial direction. The plunger is formed from a solid innocent material of noble metal and detachably constructed with the sleeve. COPYRIGHT: (C)2011,JPO&INPIT