发明名称 BOND PAD WITH MULTIPLE LAYER OVER PAD METALLIZATION AND METHOD OF FORMATION
摘要 A semiconductor device structure (10) has a semiconductor die (11) that has a bond pad (14) with a passivation layer (18) surrounding a portion of the bond pad. A nickel layer (16), which is deposited, is on the inner portion. A space (20) is between a sidewall of the nickel layer and the passivation layer and extends to the bond pad. A palladium layer (24') is over the nickel layer and fills the space. The space is initially quite small (20) but is widened (20') by an isotropic etch so that when the palladium layer is deposited, the space (20) is sufficiently large so that the deposition of palladium is able to fill the space (20'). Filling the space results in a structure in which the palladium contacts the nickel layer, the passivation layer and the bond pad.
申请公布号 WO2011100021(A2) 申请公布日期 2011.08.18
申请号 WO2010US59662 申请日期 2010.12.09
申请人 FREESCALE SEMICONDUCTOR, INC.;VARUGHESE, MATHEW 发明人 VARUGHESE, MATHEW
分类号 H01L23/48;H01L21/60 主分类号 H01L23/48
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