发明名称 THREE-DIMENSIONAL POSITION MEASURING AND MARKING SYSTEM, AND METHOD OF USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a three-dimensional position measuring and marking system capable of measurement in a narrow part. SOLUTION: This three-dimensional position measuring and marking system includes: a three-dimensional measuring machine capable of measuring a three-dimensional coordinate of a collimated point by irradiation with laser, and transmitting/receiving data; a measuring/marking device capable of receiving the laser, and irradiating with the laser; and a host computer capable of receiving measurement data from the three-dimensional measuring machine and the measuring/marking device, calculating the coordinate of an indication point, and transmitting/receiving the data. The measuring/marking device has a sensor housing rotatable around a vertical axis, and a laser range finder supported by a two degree-of-freedom rotating mechanism. An incident angle sensor, an inclination sensor and a prism are loaded on the sensor housing, and the incident angle sensor is irradiated with the laser with which the prism is irradiated. Measurement in a short time becomes possible, and an influence of camera shake is reduced. Even in the case of a floor surface or a wall surface on the back of an obstacle, measurement is performed by turning around from the side of the obstacle, and marking is also enabled. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011158371(A) 申请公布日期 2011.08.18
申请号 JP20100021016 申请日期 2010.02.02
申请人 SHINRYO CORP 发明人 SAKAMOTO SHINTARO;KISHIMOTO YOKI;TANAKA YUKINOBU
分类号 G01C15/00;G01C15/02 主分类号 G01C15/00
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