发明名称 ANALYZER, AND ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an analyzer capable of suppressing the irregularity of a measured value in a surface-enhanced Raman spectroscopic method, and an analyzing method. SOLUTION: There are disclosed: the analyzer 1 equipped with a magnetism collection member 31 for applying magnetism collection processing to a reaction container in which a specimen, magnetic particles and a reagent containing labelled particles comprising metal nanoparticles are dispensed to form flocculated matter where a composite of the measuring target in a specimen and a reagent is flocculated and a photometric unit 33 for spectrally diffracting Raman scattered light emitted by irradiating the flocculated matter with the laser beam emitted from a laser beam source to photometrically measure it to analyze the specimen on the basis of surface-enhanced Raman scattered light photometrically measured by the photometric unit; and an analyzing method. The analyzer 1 suppresses the quantity of the energy per unit time and unit area of the laser beam to be irradiated with a flocculated matter to 0.001-0.005 mW/μm<SP>2</SP>. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011158327(A) 申请公布日期 2011.08.18
申请号 JP20100019211 申请日期 2010.01.29
申请人 BECKMAN COULTER INC 发明人 YOSHIKAWA EMIKO;MIZUTANI TAKAYUKI
分类号 G01N21/65 主分类号 G01N21/65
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