发明名称 Switching device with integrated test means
摘要 <p>Two radio frequency generators (22,23) are controlled by a common clock signal generator (VCO) placed at one corner of a switching matrix (20) and are paired with corresponding detectors (21,24). Each generator/detector pair is situated at opposite corners of the switching matrix and monitors adjacent sets of inputs and outputs (OUT1, - OUTn)(OUTn+1, - OUT2n) .</p>
申请公布号 EP1315343(B1) 申请公布日期 2011.08.17
申请号 EP20020079740 申请日期 2002.11.14
申请人 NXP B.V. 发明人 GLOAGUEN, GILBERT;BURG, OLIVIER;FAHS, BASSEM
分类号 G01R31/28;G06F11/26;H03K17/00;H04L12/933;H04L12/939;H04Q3/52 主分类号 G01R31/28
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