发明名称 |
Use of a positive resist composition for immersion exposure, positive resist composition and immersion lithographic pattern-forming method using the same |
摘要 |
<p>A positive resist composition for immersion exposure comprises: (A) a resin capable of increasing its solubility in an alkali developer by an action of an acid, and (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation, wherein the acid satisfies conditions of V ‰§ 230 and V/S ‰¦ 0.93 taking van der Waals volume of the acid as V (Å 3 ), and van der Waals surface area of the acid as S (Å 2 ).</p> |
申请公布号 |
EP1764647(B1) |
申请公布日期 |
2011.08.17 |
申请号 |
EP20060017164 |
申请日期 |
2006.08.17 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
INABE, HARUKI;KANDA, HIROMI;KODAMA, KUNIHIKO |
分类号 |
G03F7/004;G03F7/029;G03F7/039;G03F7/20 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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