发明名称 Use of a positive resist composition for immersion exposure, positive resist composition and immersion lithographic pattern-forming method using the same
摘要 <p>A positive resist composition for immersion exposure comprises: (A) a resin capable of increasing its solubility in an alkali developer by an action of an acid, and (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation, wherein the acid satisfies conditions of V ‰§ 230 and V/S ‰¦ 0.93 taking van der Waals volume of the acid as V (Å 3 ), and van der Waals surface area of the acid as S (Å 2 ).</p>
申请公布号 EP1764647(B1) 申请公布日期 2011.08.17
申请号 EP20060017164 申请日期 2006.08.17
申请人 FUJIFILM CORPORATION 发明人 INABE, HARUKI;KANDA, HIROMI;KODAMA, KUNIHIKO
分类号 G03F7/004;G03F7/029;G03F7/039;G03F7/20 主分类号 G03F7/004
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