发明名称 Method for fabricating semiconductor device
摘要 A method of fabricating a semiconductor device includes forming a via hole in a semiconductor substrate, forming an isolation layer on an inner side of the via hole, forming a diffusion barrier layer over an upper portion of the semiconductor substrate and the inner side of the via hole where the isolation layer is formed, arranging a solvent, which contains electrically charged metal particles, on the semiconductor substrate where the diffusion barrier layer is formed, and filling the via hole with the metal particles by moving the metal particles using applied external force. The applied external force said includes a voltage causing an electric current to flow between the semiconductor substrate and the solvent, an electrical field applied between the semiconductor substrate and the solvent, or a magnetic field applied between the semiconductor substrate and the solvent.
申请公布号 US7998862(B2) 申请公布日期 2011.08.16
申请号 US20100689344 申请日期 2010.01.19
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 PARK KUNSIK;BAEK KYU-HA;DO LEE-MI;KIM DONG-PYO;PARK JI MAN
分类号 H01L21/4763;H01L21/44 主分类号 H01L21/4763
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