发明名称 Void reduction in indium thermal interface material
摘要 Thermal interface materials and method of using the same in packaging are provided. In one aspect, a thermal interface material is provided that includes an indium preform that has a first surface and a second surface opposite to the first surface, an interior portion and a peripheral boundary. The indium preform has a channel extending from the peripheral boundary towards the interior portion. The channel enables flux to liberate during thermal cycling.
申请公布号 US7999394(B2) 申请公布日期 2011.08.16
申请号 US20090638112 申请日期 2009.12.15
申请人 ADVANCED MICRO DEVICES, INC. 发明人 TOO SEAH SUN;LIAU HSIANG WAN;KIRKLAND JANET;TAN TEK SENG;TOUZELBAEV MAXAT;MASTER RAJ N.
分类号 H01L23/48;H01L23/12 主分类号 H01L23/48
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