发明名称 Vertical interconnect structure, memory device and associated production method
摘要 The present invention relates to a method for producing a vertical interconnect structure, a memory device and an associated production method, in which case, after the formation of a contact region in a carrier substrate a catalyst is produced on the contact region and a free-standing electrically conductive nanoelement is subsequently formed between the catalyst and the contact region and embedded in a dielectric layer.
申请公布号 US7998858(B2) 申请公布日期 2011.08.16
申请号 US20060588769 申请日期 2006.10.27
申请人 INFINEON TECHNOLOGIES AG 发明人 GUTSCHE MARTIN;KREUPL FRANZ;SEIDL HARALD
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
主权项
地址