发明名称 Circuit testing closer apparatus and method with dynamic test thresholds
摘要 A circuit testing closer is capable of closing a power distribution circuit and interrupting the resulting current at the next current zero. Upon detecting a fault, the circuit testing closer is operable to open contacts to isolate the fault. Next, the circuit testing closer tests the faulted line to determine whether the fault has cleared. The circuit testing closer may employ one or more dynamic thresholds to determine the existence of a fault.
申请公布号 US8000069(B2) 申请公布日期 2011.08.16
申请号 US20090469179 申请日期 2009.05.20
申请人 S&C ELECTRIC COMPANY 发明人 MONTENEGRO ALEJANDRO;O'LEARY RAYMOND P.
分类号 H02H3/00 主分类号 H02H3/00
代理机构 代理人
主权项
地址