发明名称 Thinned image sensor with trench-insulated contact terminals
摘要 The invention relates to the fabrication of thinned substrate image sensors, and notably color image sensors. After the fabrication steps carried out from the front face of a silicon substrate the front face is transferred onto a substrate. The silicon is thinned, and the connection terminals are produced by the rear face. A multiplicity of localized contact holes are opened through the thinning silicon, in the location of a connection terminal. The holes exposing a first conductive layer (24) are formed during the front face steps. Aluminum (42) is deposited on the rear face, in contact with the silicon, with the aluminum penetrating into the openings and coming into contact with the first layer. The aluminum is etched to delimit the connection terminal. Finally, a peripheral trench is opened through the entire thickness of the silicon layer, and this trench completely surrounds the connection terminal.
申请公布号 US7998780(B2) 申请公布日期 2011.08.16
申请号 US20060158947 申请日期 2006.11.06
申请人 E2V SEMICONDUCTORS 发明人 BLANCHARD PIERRE
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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