| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe and probe unit that acquire stable conduction characteristics during inspection. SOLUTION: This contact probe includes a first plate section that has a plate shape and is fixed to a probe holder for holding the contact probe, a first projection that projects from an end of the first plate section and has an acute end, a second plate section that has a plate shape having the same thickness as the first plate section and where facing plate surfaces pass the same plane as one plate surface of the first plate section, a second projection projecting from an end of the second plate section, and a connection section that has a band-like curve with the same thickness as those of the first and second plate sections, extends between the first plate section and the second plate section, and connects the first plate section to the second plate section. COPYRIGHT: (C)2011,JPO&INPIT
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